basmma.blogg.se - Xf and spectrum

A mirror and lens direct the image of the measurement location to a color video camera.

A light source (not shown in the figure) illuminates the sample.

The shutter serves as a safety device and closes the access of the primary X-radiation to the measurement chamber, if needed.

Accelerated by the applied high voltage to very high speeds, the electrons bombard the anode material. The electrically heated cathode emits electrons.

The X-ray tube generates the primary X-radiation.

Functional Principle of a FISCHERSCOPE ® X-Ray Fluorescence Spectroscopy (XRF) Instrument In the process the K α and K β radiation is generated, which is characteristic for the particular material.įor further information see the Wikipedia page about XRF. The resultant void is filled by either an electron from the L shell or an electron from the M shell. One electron from the K shell is knocked. The generation of the X-ray fluorescence radiation is shown simplified in the figure above. This fluorescence radiation is evaluated by the detector. Electrons from outer electron shells fill the resultant voids emitting a fluorescence radiation that is characteristic in its energy distribution for a particular material. In the process electrons from the inner electron shells are knocked. The specimen is excited with the primary X-radiation. The Principle of the X-Ray Fluorescence Spectroscopy (XRF) Universally applicable: The XRF method is suitable for material analysis and conting thickness measurment in a very broad range of applications.Safe: Method without the use of environmentally hazardous chemicals, X-radiation poses no risk for operator due to the protective instrument design.

Fast: The XRF method needs very simple sample preparation and short measurement times range in the seconds, rarely longer than one minute.Non-destructive: The X-radiation has absolutely no lasting influence on the material it fully retains its quality.FISCHERSCOPE ® XRF instruments have the following advantages: In both laboratory and industrial environments, the fluorescence spectroscopy (XRF) is now well established and can be readily utilised with modern equipment. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coatings and coating systems. The energy dispersive X-ray fluorescence spectroscopy (XRF) is a method for measuring the thickness of coatings and for analysing materials.